Scale-dependent relationship between wheat yield and topographic indices: A wavelet approach

Soil Science Society of America Journal

Volumn 68, Issue 2, 2004, Pages 577-587

  Si, Bing Cheng ^a   Farrell, Richard E ^a  

^a UNIVERSITY OF SASKATCHEWAN   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CLAY; GRAIN (AGRICULTURAL PRODUCT); PARAMETER ESTIMATION; SOILS; VARIATIONAL TECHNIQUES; WAVELET TRANSFORMS; WETTING;

SOIL MANAGEMENT; TOPOGRAPHY;

CROPS;

CLAY LOAM; CROP YIELD; TOPOGRAPHIC EFFECT; WAVELET;

TRITICUM AESTIVUM;

EID: 1542351158     PISSN: 03615995     EISSN: None     Source Type: Journal    
DOI: 10.2136/sssaj2004.5770     Document Type: Article

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