Life tests of Nichia AlGaN/InGaN/GaN blue-light-emitting diodes

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2683, Issue , 1996, Pages 74-80

  Helms, C J ^a   Berg, N H ^a   Barton, D L ^a   Osinski M ^b  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b UNIVERSITY OF NEW MEXICO   (United States)

Author keywords

Blue; Degradation; Gan; Group III nitrides; LED; Life test; Optoelectronics

Indexed keywords

ALUMINUM GALLIUM NITRIDE; DEGRADATION; III-V SEMICONDUCTORS; OPTICAL FIBER FABRICATION; OPTICAL FIBERS; OPTOELECTRONIC DEVICES; SEMICONDUCTOR LASERS; WIDE BAND GAP SEMICONDUCTORS;

BLUE; BLUE LIGHT EMITTING DIODES; CONTINUOUS WAVES; DATA COLLECTION; GENERAL TRENDS; GROUP III NITRIDES; LIFE-TESTS; OUTPUT INTENSITY;

LIGHT EMITTING DIODES;

EID: 1542340890     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.237678     Document Type: Conference Paper

References (11)

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