Development of a Novel Planar Mesh Type Micro-magnetic Sensor for the Qualitynn Inspection of Electroplated Materials

Proceedings of IEEE Sensors

Volumn 1, Issue 2, 2002, Pages 741-746

  Mukhopadhyay, S C ^a  

^a MASSEY UNIVERSITY   (New Zealand)

Author keywords

Electroplated material; Meander and mesh configuration; Nondestructive evaluation technique; Planar type sensors; Transfer impedance

Indexed keywords

ELECTRIC IMPEDANCE; ELECTROPLATED PRODUCTS; MAGNETIC PERMEABILITY; MATHEMATICAL MODELS; NONDESTRUCTIVE EXAMINATION;

ELECTROPLATED MATERIAL; MEANDER AND MESH CONFIGURATION; MICRO MAGNETIC SENSORS; PLANAR TYPE SENSORS; TRANSFER IMPEDANCE;

SENSORS;

EID: 1542331569     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)

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