The v6, v8, 3v4 + v12 infrared system of Si2H6 under high resolution: Rotational and torsional analysis

Molecular Physics

Volumn 101, Issue 18, 2003, Pages 2895-2906

  Lattanzi, F ^a   Di Lauro, C ^a   Horneman, V M ^b  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^b UNIVERSITY OF OULU   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; ELASTIC WAVES; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GROUND STATE; MOLECULAR ORIENTATION; MOLECULAR VIBRATIONS; PERTURBATION TECHNIQUES; SILICON COMPOUNDS;

INTRINSIC SPLITTINGS; ROTATIONAL ANALYSIS; TORSIONAL ANALYSIS;

MOLECULAR PHYSICS;

EID: 1542318102     PISSN: 00268976     EISSN: None     Source Type: Journal    
DOI: 10.1080/00268970310001598722     Document Type: Article

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