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Volumn , Issue , 1998, Pages 226-230

A New Metric for Color Halftone Visibility

Author keywords

[No Author keywords available]

Indexed keywords

COLOR HALFTONING; FREQUENCY NOISE MEASUREMENT;

EID: 1542303570     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (4)

References (12)
  • 11
    • 0030651887 scopus 로고    scopus 로고
    • Color image quality metric S-CIELAB and its application on halftone texture visibility
    • X. Zhang, D. A. Silverstein, J. E. Farrell, and B. A. Wandell, "Color image quality metric S-CIELAB and its application on halftone texture visibility," IEEE Comp. Confer., 1997.
    • (1997) IEEE Comp. Confer.
    • Zhang, X.1    Silverstein, D.A.2    Farrell, J.E.3    Wandell, B.A.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.