메뉴 건너뛰기




Volumn , Issue , 1999, Pages 225-230

A Novel Approach to the Derivation of Expressions for Geometrical MTF in Sampled Systems

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; COMPUTATIONAL GEOMETRY; CONSTRAINT THEORY; CORRELATION METHODS; EDGE DETECTION; FREQUENCIES; MEASUREMENT ERRORS; SENSITIVITY ANALYSIS; SIGNAL PROCESSING; TRANSFER FUNCTIONS;

EID: 1542303441     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (6)

References (9)
  • 1
    • 1542303620 scopus 로고    scopus 로고
    • Benchmarking of the ISO 12233 Slanted-edge Spatial Frequency Response (SFR) Plug-in
    • st IS&T PICS Conf., 133-136, (1998).
    • (1998) st IS&T PICS Conf. , pp. 133-136
    • Williams, D.1
  • 3
    • 1542273409 scopus 로고    scopus 로고
    • Tradeoff Between Aliasing Artifacts and Sharpness in Assessing Image Quality
    • st IS&T PICS Conf., 247-256, (1998).
    • (1998) st IS&T PICS Conf. , pp. 247-256
    • Kriss, M.1
  • 4
    • 1542289300 scopus 로고    scopus 로고
    • Evaluating Cameras: About MTF
    • May
    • D Lake, Evaluating Cameras: About MTF, Advanced Imaging, 16-18, (May 1996).
    • (1996) Advanced Imaging , pp. 16-18
    • Lake, D.1
  • 6
    • 1542379270 scopus 로고
    • Effect of Non-Linearities when Applying Modulation Transfer Techniques to Photographic Systems
    • C N Nelson, F C Eisen and G C Higgins, Effect of Non-Linearities when Applying Modulation Transfer Techniques to Photographic Systems, Proc. SPIE, 13, 127-134, (1968).
    • (1968) Proc. SPIE , vol.13 , pp. 127-134
    • Nelson, C.N.1    Eisen, F.C.2    Higgins, G.C.3
  • 8
    • 1542319402 scopus 로고
    • Image MTF Analysis Using Grain Noise
    • M Gouch and M Roe, Image MTF Analysis Using Grain Noise, Proc. SPIE, 1987, 96-102, (1993).
    • (1993) Proc. SPIE , vol.1987 , pp. 96-102
    • Gouch, M.1    Roe, M.2
  • 9
    • 1542289299 scopus 로고    scopus 로고
    • 236 Henderson Drive, Penfield, New York 14526, USA
    • R Lamberts, Sine Patterns, 236 Henderson Drive, Penfield, New York 14526, USA.
    • Sine Patterns
    • Lamberts, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.