메뉴 건너뛰기




Volumn , Issue , 2003, Pages 779-784

Experimental and Theoretical Investigation on the Relationship between AlN Properties and AlN-based FBAR Characteristics

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC RESONATORS; ACOUSTIC SURFACE WAVE DEVICES; ATOMIC FORCE MICROSCOPY; CRYSTAL ORIENTATION; ELECTRODES; EPITAXIAL GROWTH; MAGNETRON SPUTTERING; PIEZOELECTRIC MATERIALS; POLYCRYSTALLINE MATERIALS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 1542275528     PISSN: 01616404     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (12)

References (11)
  • 1
    • 0033293124 scopus 로고    scopus 로고
    • Thin Film Resonators and Filters
    • K.M. Lakin, "Thin Film Resonators and Filters", IEEE Ultrasonics Symp., pp. 895-906, 1999.
    • (1999) IEEE Ultrasonics Symp. , pp. 895-906
    • Lakin, K.M.1
  • 2
    • 0033887359 scopus 로고    scopus 로고
    • Measurements of the Bulk, C-Axis Electromechanical Coupling Constant as a Function of AlN Film Quality
    • R.S. Naik, J.J. Lutsky, and R. Reif, "Measurements of the Bulk, C-Axis Electromechanical Coupling Constant as a Function of AlN Film Quality", IEEE Trans. Ultrason., Ferroelect., Freq. Contr. Vol. 47, pp. 292-296, 2000.
    • (2000) IEEE Trans. Ultrason., Ferroelect., Freq. Contr. , vol.47 , pp. 292-296
    • Naik, R.S.1    Lutsky, J.J.2    Reif, R.3
  • 3
    • 0033077929 scopus 로고    scopus 로고
    • Low-Temperature Deposition of Highly Textured Aluminum Nitride by Direct Current Magnetron Sputtering for Applications in Thin-Film Resonators
    • R.A. Naik, R. Reif, J. J. Lutsky, and C. G. Sodini, "Low-Temperature Deposition of Highly Textured Aluminum Nitride by Direct Current Magnetron Sputtering for Applications in Thin-Film Resonators", J. Electrochem. Soc., 146, pp. 691-696, 1999.
    • (1999) J. Electrochem. Soc. , vol.146 , pp. 691-696
    • Naik, R.A.1    Reif, R.2    Lutsky, J.J.3    Sodini, C.G.4
  • 4
    • 0034580019 scopus 로고    scopus 로고
    • Modified Butterworth-Van Dyke Circuit for FBAR Resonators and Automated Measurement System
    • J.D. Larson III, P.D. Bradley, S. Wartenberg, and R.C. Ruby, "Modified Butterworth-Van Dyke Circuit for FBAR Resonators and Automated Measurement System", IEEE Ultrasonics Symp., pp. 863-868, 2000.
    • (2000) IEEE Ultrasonics Symp. , pp. 863-868
    • Larson III, J.D.1    Bradley, P.D.2    Wartenberg, S.3    Ruby, R.C.4
  • 6
    • 0032674582 scopus 로고    scopus 로고
    • Preparation of highly oriented AlN thin films on glass substrates by helicon plasma sputtering and design of experiments
    • M. Akiyama, T. Harada, C.N. Xu, K. Nonaka, and T. Watanabe, "Preparation of highly oriented AlN thin films on glass substrates by helicon plasma sputtering and design of experiments". Thin Solid Films 350, pp. 85-90, 1999.
    • (1999) Thin Solid Films , vol.350 , pp. 85-90
    • Akiyama, M.1    Harada, T.2    Xu, C.N.3    Nonaka, K.4    Watanabe, T.5
  • 7
    • 0035372147 scopus 로고    scopus 로고
    • Morphological properties of AlN piezoelectric thin films deposited by DC reactive magnetron sputtering
    • X.H. Xu, H.S. Wu, C.J. Zhang, and Z.H. Jin, "Morphological properties of AlN piezoelectric thin films deposited by DC reactive magnetron sputtering", Thin Solid Films 388, pp. 62-67, 2001.
    • (2001) Thin Solid Films , vol.388 , pp. 62-67
    • Xu, X.H.1    Wu, H.S.2    Zhang, C.J.3    Jin, Z.H.4
  • 11
    • 0033294874 scopus 로고    scopus 로고
    • The Influence of ZnO and Electrode Thickness on the performance of Thin Film Bulk Acoustic Wave Resonators
    • P. Osbond, C.M Beck, C.J. Brierley, M.R. Cox, S.P. Marsh, and N.M. Shorrocks, "The Influence of ZnO and Electrode Thickness on the performance of Thin Film Bulk Acoustic Wave Resonators". IEEE Ultrasonics Symp., pp. 911-914, 1999.
    • (1999) IEEE Ultrasonics Symp. , pp. 911-914
    • Osbond, P.1    Beck, C.2    Brierley, C.J.3    Cox, M.R.4    Marsh, S.P.5    Shorrocks, N.M.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.