-
1
-
-
0033293124
-
Thin Film Resonators and Filters
-
K.M. Lakin, "Thin Film Resonators and Filters", IEEE Ultrasonics Symp., pp. 895-906, 1999.
-
(1999)
IEEE Ultrasonics Symp.
, pp. 895-906
-
-
Lakin, K.M.1
-
2
-
-
0033887359
-
Measurements of the Bulk, C-Axis Electromechanical Coupling Constant as a Function of AlN Film Quality
-
R.S. Naik, J.J. Lutsky, and R. Reif, "Measurements of the Bulk, C-Axis Electromechanical Coupling Constant as a Function of AlN Film Quality", IEEE Trans. Ultrason., Ferroelect., Freq. Contr. Vol. 47, pp. 292-296, 2000.
-
(2000)
IEEE Trans. Ultrason., Ferroelect., Freq. Contr.
, vol.47
, pp. 292-296
-
-
Naik, R.S.1
Lutsky, J.J.2
Reif, R.3
-
3
-
-
0033077929
-
Low-Temperature Deposition of Highly Textured Aluminum Nitride by Direct Current Magnetron Sputtering for Applications in Thin-Film Resonators
-
R.A. Naik, R. Reif, J. J. Lutsky, and C. G. Sodini, "Low-Temperature Deposition of Highly Textured Aluminum Nitride by Direct Current Magnetron Sputtering for Applications in Thin-Film Resonators", J. Electrochem. Soc., 146, pp. 691-696, 1999.
-
(1999)
J. Electrochem. Soc.
, vol.146
, pp. 691-696
-
-
Naik, R.A.1
Reif, R.2
Lutsky, J.J.3
Sodini, C.G.4
-
4
-
-
0034580019
-
Modified Butterworth-Van Dyke Circuit for FBAR Resonators and Automated Measurement System
-
J.D. Larson III, P.D. Bradley, S. Wartenberg, and R.C. Ruby, "Modified Butterworth-Van Dyke Circuit for FBAR Resonators and Automated Measurement System", IEEE Ultrasonics Symp., pp. 863-868, 2000.
-
(2000)
IEEE Ultrasonics Symp.
, pp. 863-868
-
-
Larson III, J.D.1
Bradley, P.D.2
Wartenberg, S.3
Ruby, R.C.4
-
5
-
-
34250714375
-
-
IEEE
-
K.M. Lakin, K.T. McCarron, J. Belsick, and J.F. McDonald, "Thin Film Bulk Acoustic Wave Resonator and Filter Technology", IEEE, pp. 89-92, 2001.
-
(2001)
Thin Film Bulk Acoustic Wave Resonator and Filter Technology
, pp. 89-92
-
-
Lakin, K.M.1
McCarron, K.T.2
Belsick, J.3
McDonald, J.F.4
-
6
-
-
0032674582
-
Preparation of highly oriented AlN thin films on glass substrates by helicon plasma sputtering and design of experiments
-
M. Akiyama, T. Harada, C.N. Xu, K. Nonaka, and T. Watanabe, "Preparation of highly oriented AlN thin films on glass substrates by helicon plasma sputtering and design of experiments". Thin Solid Films 350, pp. 85-90, 1999.
-
(1999)
Thin Solid Films
, vol.350
, pp. 85-90
-
-
Akiyama, M.1
Harada, T.2
Xu, C.N.3
Nonaka, K.4
Watanabe, T.5
-
7
-
-
0035372147
-
Morphological properties of AlN piezoelectric thin films deposited by DC reactive magnetron sputtering
-
X.H. Xu, H.S. Wu, C.J. Zhang, and Z.H. Jin, "Morphological properties of AlN piezoelectric thin films deposited by DC reactive magnetron sputtering", Thin Solid Films 388, pp. 62-67, 2001.
-
(2001)
Thin Solid Films
, vol.388
, pp. 62-67
-
-
Xu, X.H.1
Wu, H.S.2
Zhang, C.J.3
Jin, Z.H.4
-
8
-
-
0035398138
-
AlN epitaxial growth on off-angle R-plane sapphire substrates by MOCVD
-
T. Shibata, K. Asai, Y. Nakamura, M. Tanaka, K. Kaigawa, J. Shibata, and H. Sakai, "AlN epitaxial growth on off-angle R-plane sapphire substrates by MOCVD", J. Crystal Growth 229, pp. 63-68, 2001.
-
(2001)
J. Crystal Growth
, vol.229
, pp. 63-68
-
-
Shibata, T.1
Asai, K.2
Nakamura, Y.3
Tanaka, M.4
Kaigawa, K.5
Shibata, J.6
Sakai, H.7
-
9
-
-
0034511373
-
Mechanical and adhesion properties of A1/AlN multilayered thin films
-
J.H. Lee, W.M. Kim, T.S. Lee, M.K. Chung, B.K. Cheong, and S.G. Kim, "Mechanical and adhesion properties of A1/AlN multilayered thin films", Surf. Coat. Technol. 133-134, pp. 220-226, 2000.
-
(2000)
Surf. Coat. Technol.
, vol.133-134
, pp. 220-226
-
-
Lee, J.H.1
Kim, W.M.2
Lee, T.S.3
Chung, M.K.4
Cheong, B.K.5
Kim, S.G.6
-
10
-
-
0032094521
-
Growth of AlN films by magnetron sputtering
-
S. Uchiyama, Y. Ishigami, M. Ohta, M. Niigaki, H. Kan, Y. Nakanishi, and T. Yamaguchi, "Growth of AlN films by magnetron sputtering", J. Crystal Growth 189/190, pp. 448-451, 1998.
-
(1998)
J. Crystal Growth
, vol.189-190
, pp. 448-451
-
-
Uchiyama, S.1
Ishigami, Y.2
Ohta, M.3
Niigaki, M.4
Kan, H.5
Nakanishi, Y.6
Yamaguchi, T.7
-
11
-
-
0033294874
-
The Influence of ZnO and Electrode Thickness on the performance of Thin Film Bulk Acoustic Wave Resonators
-
P. Osbond, C.M Beck, C.J. Brierley, M.R. Cox, S.P. Marsh, and N.M. Shorrocks, "The Influence of ZnO and Electrode Thickness on the performance of Thin Film Bulk Acoustic Wave Resonators". IEEE Ultrasonics Symp., pp. 911-914, 1999.
-
(1999)
IEEE Ultrasonics Symp.
, pp. 911-914
-
-
Osbond, P.1
Beck, C.2
Brierley, C.J.3
Cox, M.R.4
Marsh, S.P.5
Shorrocks, N.M.6
|