The Reliability Analysis of High Power Switches Composed of Series and Parallel Branches

2003 IEEE Power Engineering Society General Meeting, Conference Proceedings

Volumn 1, Issue , 2003, Pages 472-479

  Heydt, Gerald Thomas ^a   James, Daniel Scott ^a   Gel, Esma Senturk ^a   Albu, Mihaela Marilena ^b   Hubele, Norma F ^a  

^a Arizona State University   (United States)

^b UNIVERSITY POLITEHNICA OF BUCHAREST   (Romania)

Author keywords

Circuit breaker; Failure modes; Reliability; Switches

Indexed keywords

COMPUTER SIMULATION; ELECTRIC CIRCUIT BREAKERS; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; FAILURE ANALYSIS; MARKOV PROCESSES; PROBABILITY DISTRIBUTIONS;

ELECTRONIC SWITCHES; FAILURE MODES;

ELECTRIC SWITCHES;

EID: 1542269777     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/pes.2003.1267223     Document Type: Conference Paper

References (6)

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3. G. Chaudhuri, K. Hu, N. Afshar, "A New Approach to System Reliability," IEEE Trans. on Reliability, v. 50, No. 1, March 2001, pp. 75-84.
4. M. Moustafa, "Reliability Model of Series-Parallel Systems," Microelectronics and Reliability, v. 34, No. 11, Nov, 1994, pp. 1821-1823.
5. A. Lesanovsky, "Systems With Two Dual Failure Modes - A Survey," Microelectronics and Reliability, v. 33, No. 10, Aug, 1993, pp. 1597-1626.
6. N. Mohan, T. Undeland, W. Robbins, Power Electronics, John Wiley and Sons, New York, 1995.