Some structural parameters of ZnSxSe1-x thin films prepared by electron beam evaporation

Physica B: Condensed Matter

Volumn 358, Issue 1-4, 2005, Pages 256-264

  Abo Hassan, Khedr M M ^a   Muhamad, M R ^b   Radhakrishna, S ^b  

^a UCSI UNIVERSITY   (Malaysia)

^b UNIVERSITY OF MALAYA   (Malaysia)

Author keywords

Lattice parameter; Micro strain; Thin films

Indexed keywords

ALGORITHMS; COMPRESSIVE STRESS; ELECTRON BEAMS; ENERGY DISPERSIVE SPECTROSCOPY; ENERGY GAP; EVAPORATION; GRAIN BOUNDARIES; LATTICE CONSTANTS; PHASE TRANSITIONS; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; SOLAR RADIATION; STOICHIOMETRY; TENSILE STRESS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

CRYSTALLOGRAPHIC ORIENTATIONS; ELECTRON BEAM EVAPORATION; MICRO-STRAIN; STRUCTURAL PARAMETERS;

ZINC ALLOYS;

EID: 15344350550     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2005.01.422     Document Type: Article

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