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Physica B: Condensed Matter

Volumn 358, Issue 1-4, 2005, Pages 181-184

Electron trapping by excited microvoids does not give rise to a Staebler-Wronski effect

(1) Overhof, Harald a

a UNIVERSITY OF PADERBORN (Germany)

Author keywords

Amorphous silicon; Staebler Wronski effect

Indexed keywords

AMORPHOUS SILICON; ANNEALING; ELECTRONS; HEAT TREATMENT; HYDROGENATION; MATHEMATICAL MODELS; PHOTOCONDUCTIVITY; PHOTOCURRENTS; PHOTODEGRADATION; PHOTONS;

PHOTOELECTRONS; PHOTOINDUCED DEGRADATION; PHOTOTRANSPORTATIONS; STAEBLER-WRONSKI EFFECT (SWE);

ELECTRON TRAPS;

EID: 15344345963 PISSN: 09214526 EISSN: None Source Type: Journal
DOI: 10.1016/j.physb.2005.01.142 Document Type: Article

Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.