Investigations on the correlation between IC-conducted emission and chip-level power supply current

IEEE Transactions on Electromagnetic Compatibility

Volumn 47, Issue 1, 2005, Pages 28-33

  Fiori, Franco ^a   Musolino, Francesco ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

Conducted emissions; Electromagnetic emission; EMC; Integrated circuits; Microcontroller

Indexed keywords

DIGITAL INTEGRATED CIRCUITS; ELECTRIC CURRENTS; ELECTROMAGNETIC WAVE EMISSION; INTEGRATED CIRCUIT TESTING; MATRIX ALGEBRA; MICROCONTROLLERS; PRINTED CIRCUIT BOARDS;

CONDUCTED EMISSION; DEVICE UNDER TEST; POWER SUPPLY CURRENT;

ELECTROMAGNETIC COMPATIBILITY;

EID: 15044364245     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEMC.2004.842203     Document Type: Article

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