Influence of interfacial scattering and surface roughness on giant magnetoresistance in Fe/Cr trilayers using ab initio layer potentials

Journal of Magnetism and Magnetic Materials

Volumn 290-291 PART 1, Issue , 2005, Pages 392-395

  Pereiro, M ^a   Botana, J ^a   Baldomir, D ^a   Warda, K ^b   Wojtczak, L ^b   Man'Kovsky, S V ^c   Iglesias, M ^a   Pardo, V ^a   Arias, J E ^a  

^a UNIVERSITY OF SANTIAGO DE COMPOSTELA   (Spain)

^b UNIVERSITY OF LODZ   (Poland)

^c INSTITUTE OF METAL PHYSICS   (Ukraine)

Author keywords

Magnetoresistance giant; Thin films thickness; Thin films trilayer

Indexed keywords

ELECTROMAGNETIC WAVE POLARIZATION; ELECTRONIC STRUCTURE; FERROMAGNETIC MATERIALS; INTERFACES (MATERIALS); MAGNETIC THIN FILMS; OSCILLATIONS; PROBABILITY DENSITY FUNCTION; SURFACE ROUGHNESS; ULTRATHIN FILMS;

FERROMAGNETIC LAYER THICKNESS (FLT); INTERFACIAL SCATTERING; MAGNETIC LAYERS; THIN FILMS-THICKNESS; THIN FILMS-TRILAYER;

GIANT MAGNETORESISTANCE;

EID: 14944382835     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2004.11.482     Document Type: Conference Paper

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