Scanning tunneling microscopy study of terminal oxygen structures on WO3(1 0 0) thin films

Surface Science

Volumn 579, Issue 2-3, 2005, Pages 175-187

  Li, M ^a   Posadas, A ^a   Ahn, C H ^a   Altman, E I ^a  

^a Yale University   (United States)

Author keywords

Epitaxy; Scanning tunneling microscopy; Surface relaxation and reconstruction; Tungsten oxide

Indexed keywords

ANNEALING; CRYSTALLOGRAPHY; EPITAXIAL GROWTH; OXYGEN; SCANNING TUNNELING MICROSCOPY; SHEARING; SURFACE STRUCTURE; THERMAL EFFECTS; THIN FILMS;

CRYSTALLOGRAPHIC SHEARING; OXYGEN STRUCTURES; SURFACE RELAXATION AND RECONSTRUCTION; TUNGSTEN OXIDE;

TUNGSTEN COMPOUNDS;

EID: 14944358704     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2005.02.007     Document Type: Article

References (37)

1. B.C. Gates Catalytic chemistry 1992 Wiley New York
2. H.H. Kung, and M.C. Kung D.D. Eley H. Pines P.B. Weisz Advances in catalysis vol. 33 1985 Academic Press New York 159
3. C.J. Machiels, W.H. Cheng, U. Chowdry, W.E. Farneth, F. Hong, E.M. McCarron, and A.W. Sleight Appl. Catal. 25 1986 249
4. J.M. Tatibouët, and J.E. Germain J. Catal. 72 1981 375
5. J.M. Tatibouët, J.E. Germain, and J.C. Volta J. Catal. 82 1983 240
6. U. Chowdry, A. Ferretti, L.E. Firment, C.J. Machiels, F. Ohuchi, A.W. Sleight, and R.H. Staley Appl. Surf. Sci. 19 1984 360
7. R.S. Weber J. Phys. Chem. 98 1994 2999
8. A. Michalak, K. Hermann, and M. Witko Surf. Sci. 366 1996 323
9. U. Diebold Surf. Sci. Rep. 48 2003 53
10. M. Li, W. Hebenstreit, U. Diebold, M.A. Henderson, and D.R. Jennison Faraday Discuss. 114 1999 245
11. M. Li, E.I. Altman, A. Posadas, and C.H. Ahn Thin Solid Films 446 2003 238
12. M. Li, W. Gao, A. Posadas, C.H. Ahn, and E.I. Altman J. Phys. Chem. B 108 2004 15259
13. H. Over, Y.D. Kim, A.P. Seitsonen, S. Wendt, E. Lundgren, M. Schmid, P. Varga, A. Morgante, and G. Ertl Science 287 2000 1474
14. R.E. Tanner, E.I. Altman, A. Sasahara, H. Onishi, and Y. Liang J. Phys. Chem. B 106 2002 8211
15. R.E. Tanner, Y. Liang, and E.I. Altman Surf. Sci. 506 2002 251
16. R.E. Tanner, P. Meethunkij, and E.I. Altman J. Phys. Chem. B 104 2000 12315
17. A. Gutiérrez-Alejandre, J. Ramírez, and G. Busca Catal. Lett. 56 1998 29
18. Y. Wang, Q. Chen, W. Yang, Z. Xie, W. Xu, and D. Huang Appl. Catal. A 250 2003 25
19. D.-S. Lee, K.-H. Nam, and D.-D. Lee Thin Solid Films 375 2000 142
20. H. Kawasaki, J. Namba, K. Iwatsuji, Y. Suda, K. Wada, K. Ebihara, and T. Ohshima Appl. Surf. Sci. 197-198 2002 547
21. A. Bessiere, C. Marcel, M. Morcrette, J.M. Tarascon, V. Lucas, B. Viana, and N. Baffier J. Appl. Phys. 91 2002 1589
22. G. Fang, D. Li, and B. Yao. J. Phys. D: Appl. Phys. 34 2001 2260
23. M. Li, E.I. Altman, A. Posadas, and C.H. Ahn Surf. Sci. 542 2003 22
24. M. Li, E.I. Altman, A. Posadas, and C.H. Ahn J. Vac. Sci. Technol. A 22 2003 1682
25. E. Salje Acta Crystallogr. B 33 1977 574
26. E. Salje, and K. Viswanathan Acta Crystallogr. A 31 1975 356
27. B.O. Loopstra, and P. Boldrini Acta Crystallogr. 21 1966 158
28. E. Salje, S. Rehmann, F. Pobell, D. Morris, K.S. Knight, Herrmannsdörfer, and T. Dove J. Phys. C: Solid State Phys. 9 1997 6563
29. R. Diehl, and G. Brandt Acta Crystallogr. B 34 1978 1105
30. R.E. Tanner, and E.I. Altman J. Vac. Sci. Technol. A 19 2001 1502
31. F.H. Jones, K. Rawlings, J.S. Foord, P.A. Cox, R.G. Egdell, J.B. Pethica, and B.M.R. Wanklyn Phys. Rev. B 52 1995 14392
32. F.H. Jones, K. Rawlings, J.S. Foord, R.G. Egdell, J.B. Pethica, B.M.R. Wanklyn, S.C. Parker, and P.M. Oliver Surf. Sci. 359 1996 107
33. F.H. Jones, R.A. Dixon, and A. Brown Surf. Sci. 369 1996 343
34. R.A. Dixon, J.J. Williams, D. Morris, J. Rebane, F.H. Jones, R.G. Egdell, and S.W. Downes Surf. Sci. 399 1998 199
35. C.Y. Nakakura, V.M. Phanse, G. Zheng, G. Bannon, E.I. Altman, and K.P. Lee Rev. Sci. Instrum. 69 1998 3251
36. D.W. Bullett J. Phys. C: Solid State Phys. 16 1983 2197
37. M. Li, A. Posadas, C.H. Ahn, and E.I. Altman J. Phys. Chem. B 108 2004 15259