SCOPUS 정보 검색 플랫폼

Microelectronic Engineering

Volumn 78-79, Issue 1-4, 2005, Pages 374-380

Building and testing submicrometer metallic (gold) air-bridges for nanotransport applications

(6) Borzenko, T a Hock, V a Supp, D a Gould, C a Schmidt, G a Molenkamp, L W a

a UNIVERSITY OF WÜRZBURG (Germany)

Author keywords

Air bridges; Electron beam lithography; Nanostructures

Indexed keywords

DIODES; ELECTRIC POTENTIAL; ELECTRON BEAM LITHOGRAPHY; ELECTRON TUNNELING; ELECTRONIC EQUIPMENT; MICROMETERS; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; RESONATORS; SEMICONDUCTOR DEVICE MANUFACTURE; VACUUM;

AIR-BRIDGES; NANOTRANSPORT APPLICATIONS; QUANTUM DOT RESONANTS; VOLTAGE LITHOGRAPHY;

GOLD;

EID: 14944358227 PISSN: 01679317 EISSN: None Source Type: Journal
DOI: 10.1016/j.mee.2004.12.050 Document Type: Conference Paper

Times cited : (5)

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