Optical constants of Ge nanolayers in oxidation of SiGe alloys determined by ellipsometry

Wuli Xuebao/Acta Physica Sinica

Volumn 54, Issue 2, 2005, Pages 972-976

  Huang, Wei Qi ^a   Liu, Shi Rong ^b  

^a GUIZHOU UNIVERSITY   (China)

^b INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

Ellipsometry; Ge nanostructures; PL spectra; Quantum confinement

Indexed keywords

EID: 14844356314     PISSN: 10003290     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)