SCOPUS 정보 검색 플랫폼

Journal of Crystal Growth

Volumn 275, Issue 3-4, 2005, Pages 580-588

Characterization of pure and substituted 0.955Pb(Zn1/3Nb 2/3)O3-0.045PbTiO3

(4) Kobor, Diouma a Lebrun, Laurent a Sébald, Gaél a Guyomar, Daniel a

a University de Lyon (France)

Author keywords

A1. Characterization; A1. X ray diffraction; A2. Single crystal growth; B1. Perovskites; B2. Piezoelectric materials

Indexed keywords

BANDWIDTH; CHARACTERIZATION; CRYSTAL GROWTH; FERROELECTRICITY; MANGANESE; PEROVSKITE; PHASE TRANSITIONS; PIEZOELECTRICITY; SINGLE CRYSTALS; SUBSTITUTION REACTIONS; X RAY DIFFRACTION ANALYSIS;

CHARGE COEFFICIENTS; DOPANTS; SINGLE-CRYSTAL GROWTH; UNIAXIAL STRESS;

LEAD COMPOUNDS;

EID: 14844342833 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/j.jcrysgro.2004.12.010 Document Type: Article

Times cited : (19)

References (14)

1
- 14844338738
- L. Lebrun, S. Zhang, C.A. Randall, T.R. Shrout, and D. Guyomar Ceramic Transac. 136 2002 117
- (2002) Ceramic Transac. , vol.136 , pp. 117
- Lebrun, L.¹ Zhang, S.² Randall, C.A.³ Shrout, T.R.⁴ Guyomar, D.⁵

2
- 0036536667
- S. Prya, and K. Uchino J. Appl. Phys. 91 7 2002 4515
- (2002) J. Appl. Phys. , vol.91 , Issue.7 , pp. 4515
- Prya, S.¹ Uchino, K.²

3
- 0037460149
- T. Liu, and C.S. Lynch Acta Mater. 51 2001 407
- (2001) Acta Mater. , vol.51 , pp. 407
- Liu, T.¹ Lynch, C.S.²

4
- 0035484090
- S. Prya, K. Uchino, and D. Viehland Jpn. J. Appl. Phys. 40 2001 L1044
- (2001) Jpn. J. Appl. Phys. , vol.40
- Prya, S.¹ Uchino, K.² Viehland, D.³

5
- 0035883334
- W. Chen, and Z.-G. Ye J. Mater. Sci. 36 2001 4393
- (2001) J. Mater. Sci. , vol.36 , pp. 4393
- Chen, W.¹ Ye, Z.-G.²

6
- 0004280253
- Marcel Dekker, Inc. New York, Basel, Hong Kong
- K. Uchino Ferroelectric Devices 2000 Marcel Dekker, Inc. New York, Basel, Hong Kong
- (2000) Ferroelectric Devices
- Uchino, K.¹

7
- 0003999843
- Academic Press New York
- B. Jaffe, W. Cook, and H. Jaffe Piezoelectric Ceramics 1971 Academic Press New York
- (1971) Piezoelectric Ceramics
- Jaffe, B.¹ Cook, W.² Jaffe, H.³

8
- 0002023704
- Q. Tan, and D. Viehland Philos. Mag. B 76 1997 59
- (1997) Philos. Mag. B , vol.76 , pp. 59
- Tan, Q.¹ Viehland, D.²

9
- 0038003851
- S. Zhang, L. Lebrun, D.-Y. Jeong, C.A. Randall, Q. Zhang, and T.R. Shrout J. Appl. Phys. 93 11 2003 9257
- (2003) J. Appl. Phys. , vol.93 , Issue.11 , pp. 9257
- Zhang, S.¹ Lebrun, L.² Jeong, D.-Y.³ Randall, C.A.⁴ Zhang, Q.⁵ Shrout, T.R.⁶

10
- 4344635591
- A. Benayad, D. Kobor, L. Lebrun, B. Guiffard, and D. Guyomar J. Crystal Growth 270 2004 137
- (2004) J. Crystal Growth , vol.270 , pp. 137
- Benayad, A.¹ Kobor, D.² Lebrun, L.³ Guiffard, B.⁴ Guyomar, D.⁵

11
- 0034893878
- L. Lebrun, B. Guiffard, D. Audigier, E. Boucher, D. Guyomar, L. Eyraud, and E. Pleska J. Eur. Ceramic Soc. 21 2001 1357
- (2001) J. Eur. Ceramic Soc. , vol.21 , pp. 1357
- Lebrun, L.¹ Guiffard, B.² Audigier, D.³ Boucher, E.⁴ Guyomar, D.⁵ Eyraud, L.⁶ Pleska, E.⁷

12
- 0035388575
- M. Dong, and Z.-G. Ye Jpn. J. Appl. Phys. 40 2001 4604
- (2001) Jpn. J. Appl. Phys. , vol.40 , pp. 4604
- Dong, M.¹ Ye, Z.-G.²

13
- 14844363047
- Thesis, INSA, December
- E. Boucher, Thesis, INSA, December 2002.
- (2002)
- Boucher, E.¹

14
- 0004048477
- ANSI/IEEE Std, US, IEEE
- IEEE Standard on piezoelectricity, ANSI/IEEE Std, US, IEEE, vol. 176, 1987, p. 54.
- (1987) IEEE Standard on Piezoelectricity , vol.176 , pp. 54

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.