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Volumn 44, Issue 7, 2005, Pages 1191-1199

Double lateral shearing interferometer for the quantitative measurement of tear film topography

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; DATA REDUCTION; DYNAMICS; INTERFEROMETERS; LIGHTING; PRODUCT DESIGN; SHEARING; WAVEFRONTS;

EID: 14844335678     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.44.001191     Document Type: Article
Times cited : (32)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.