Prism-based excitation wavelength selection for multicolor fluorescence coincidence measurements

Applied Optics

Volumn 44, Issue 6, 2005, Pages 893-897

  Kassies, Roel ^a   Lenferink, Aufried ^a,b   Segers Nolten, Ine ^a   Otto, Cees ^b  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; CHROMOPHORES; DISPERSION (WAVES); EMISSION SPECTROSCOPY; KRYPTON; LASER BEAMS; LIGHT REFLECTION; OPTICAL MICROSCOPY; PRISMS;

FLUORESCENCE COINCIDENCE MEASUREMENTS; LASER SYSTEMS; RETROREFLECTORS; SNELL LAW;

FLUORESCENCE;

EID: 14844324993     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.44.000893     Document Type: Article

References (7)

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