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Volumn 230, Issue 1-4, 2005, Pages 240-245

Interface mixing induced by swift heavy ions at metal-oxide/silicon interfaces

Author keywords

Ion beam mixing; Nuclear tracks; Swift heavy ions

Indexed keywords

CHEMICAL REACTIONS; CRYSTALLIZATION; DEGRADATION; DEPOSITION; ENERGY TRANSFER; INTERFACES (MATERIALS); ION BEAMS; MAGNETRON SPUTTERING; MIXING; RUTHERFORD BACKSCATTERING SPECTROSCOPY; TITANIUM DIOXIDE; X RAY DIFFRACTION;

EID: 14744303583     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.12.048     Document Type: Conference Paper
Times cited : (14)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.