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Volumn 230, Issue 1-4, 2005, Pages 240-245
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Interface mixing induced by swift heavy ions at metal-oxide/silicon interfaces
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Author keywords
Ion beam mixing; Nuclear tracks; Swift heavy ions
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Indexed keywords
CHEMICAL REACTIONS;
CRYSTALLIZATION;
DEGRADATION;
DEPOSITION;
ENERGY TRANSFER;
INTERFACES (MATERIALS);
ION BEAMS;
MAGNETRON SPUTTERING;
MIXING;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
TITANIUM DIOXIDE;
X RAY DIFFRACTION;
INTERFACE MIXING;
ION BEAM MIXING;
NUCLEAR TRACKS;
SWIFT HEAVY ION;
HEAVY IONS;
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EID: 14744303583
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2004.12.048 Document Type: Conference Paper |
Times cited : (14)
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References (9)
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