Strain path effects on the microstructure evolution and mechanical properties of Zr702

Materials Science and Engineering: A

Volumn 395, Issue 1-2, 2005, Pages 77-86

  Cao, W Q ^a   Yu, S H ^a   Chun, Y B ^a   Yoo, Y C ^a   Lee, C M ^a   Shin, D H ^b   Hwang, S K ^a  

^a Inha University   (South Korea)

^b Hanyang University   (South Korea)

Author keywords

ECAP; Geometrically necessary boundaries; Microstructure; TEM; Yield stress; Zr702

Indexed keywords

CRYSTAL MICROSTRUCTURE; DEFORMATION; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; METAL PRESSING; STRAIN; STRESSES;

EQUAL CHANNEL ANGULAR PRESSING (ECAP); GRAIN REFINEMENT; LAMELLAR STRUCTURE; STRAIN PATH EFFECTS;

ZIRCONIUM COMPOUNDS;

MECHANICAL PROPERTY;

EID: 14744296358     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2004.12.019     Document Type: Article

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