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Volumn 152, Issue 2, 2005, Pages
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H+ conduction in solid-state electrochromic devices analyzed by transient current measurements
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Author keywords
[No Author keywords available]
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Indexed keywords
DIFFUSION;
ELECTRIC CURRENT MEASUREMENT;
ELECTRODES;
ELECTROLYTES;
HYDROGEN;
MAGNETRON SPUTTERING;
NICKEL COMPOUNDS;
PHOTOEMISSION;
PROTONS;
THIN FILM DEVICES;
TRANSIENTS;
TUNGSTEN COMPOUNDS;
X RAY DIFFRACTION ANALYSIS;
IONIC CURRENTS;
NANOCRYSTALLINE STRUCTURE;
PROTON DIFFUSION;
TRANSIENT CURRENTS;
ELECTROCHROMIC DEVICES;
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EID: 14744292642
PISSN: 00134651
EISSN: None
Source Type: Journal
DOI: 10.1149/1.1849775 Document Type: Article |
Times cited : (7)
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References (12)
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