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Volumn 358, Issue 5 SPEC. ISS., 2005, Pages 1358-1364

The preparation and structural characterisation of thiolato anions of bismuth(III)

Author keywords

Bismuth(III); Halothiolato anions; Thiolato anions; X ray crystallography

Indexed keywords

NEGATIVE IONS; X RAY CRYSTALLOGRAPHY;

EID: 14644445172     PISSN: 00201693     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ica.2004.03.025     Document Type: Article
Times cited : (12)

References (14)
  • 11
    • 0004187205 scopus 로고    scopus 로고
    • Bruker Analytical X-ray Instruments Inc., Madison, WI
    • SMART diffractometer control software, Bruker Analytical X-ray Instruments Inc., Madison, WI, 1998
    • (1998) SMART Diffractometer Control Software
  • 12
    • 0003601117 scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, WI
    • SAINT integration software, Siemens Analytical X-ray Instruments Inc., Madison, WI, 1994
    • (1994) SAINT Integration Software
  • 13
    • 84879981909 scopus 로고    scopus 로고
    • Bruker Analytical X-ray Instruments Inc., Madison, WI
    • SHELXTL program system version 5.1, Bruker Analytical X-ray Instruments Inc., Madison, WI, 1998
    • (1998) SHELXTL Program System Version 5.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.