A landmark-based approach of shape dissimilarity

Proceedings - International Conference on Pattern Recognition

Volumn 1, Issue , 1996, Pages 120-124

  Van Der Heijden, G W A M ^a   Vossepoel, A M ^b  

^a WAGENINGEN UNIVERSITY   (Netherlands)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

PATTERN RECOGNITION;

ARC-LENGTH PARAMETRIZATION; BIOLOGICAL VARIATION; DISSIMILARITY MEASURES; EQUAL INTERVALS;

CARBON DIOXIDE ARC WELDING;

EID: 14644423483     PISSN: 10514651     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICPR.1996.546003     Document Type: Conference Paper

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