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Volumn 738, Issue 1-3, 2005, Pages 33-38
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Capability of X-ray diffraction to the determination of the macroscopic linear susceptibility in a crystalline environment: The case of 3-Methyl 4-Nitropyridine N-oxide (POM)
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Author keywords
Electron charge density; Linear polarizability; Macroscopic linear susceptibility; Nonlinear optical compound (NLO)
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Indexed keywords
CARRIER CONCENTRATION;
GROUND STATE;
MOLECULES;
OPTICAL PROPERTIES;
POLARIZATION;
X RAY DIFFRACTION;
CHARGE DISTRIBUTION;
HYPERPOLARIZABILITY;
OPTICAL NONLINEARITY;
QUADRUPOLE MOMENT;
ORGANIC COMPOUNDS;
3 METHYL 4 NITROPYRIDINE N OXIDE;
OXIDE;
UNCLASSIFIED DRUG;
ARTICLE;
CALCULATION;
CRYSTAL;
OPTICS;
X RAY DIFFRACTION;
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EID: 14644397258
PISSN: 00222860
EISSN: None
Source Type: Journal
DOI: 10.1016/j.molstruc.2004.10.067 Document Type: Article |
Times cited : (15)
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References (22)
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