A Bayesian approach to classification of multiresolution remote sensing data

IEEE Transactions on Geoscience and Remote Sensing

Volumn 43, Issue 3, 2005, Pages 539-547

  Storvik, Geir ^a,b   Fjørtoft, Roger ^c   Solberg, Anne H Schistad ^a  

^a UNIVERSITY OF OSLO   (Norway)

^b NORWEGIAN COMPUTING CENTER   (Norway)

^c CNES   (France)

Author keywords

Bayesian modeling; Classification; Expectation maximization (EM) algorithm; Iterative conditional mode (ICM); Multiresolution data

Indexed keywords

ALGORITHMS; IMAGE ANALYSIS; ITERATIVE METHODS; OPTICAL RESOLVING POWER; PATTERN MATCHING; SENSOR DATA FUSION; SPECTRUM ANALYSIS;

BAYESIAN MODELING; CLASSIFICATION; EXPECTATION MAXIMIZATION (EM) MODELING; ITERATIVE CONDITIONAL MODE (ICM); MULTIRESOLUTIONAL DATA;

REMOTE SENSING;

EID: 14644396140     PISSN: 01962892     EISSN: None     Source Type: Journal    
DOI: 10.1109/TGRS.2004.841395     Document Type: Conference Paper

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