Effect of the variation of temperature on the structural and optical properties of ZnO thin films prepared on Si (1 1 1) substrates using PLD

Vacuum

Volumn 78, Issue 1, 2005, Pages 53-57

  Wang, Zhao Yang ^a   Hu, Li Zhong ^a   Zhao, Jie ^a   Sun, Jie ^b   Wang, Zhi Jun ^a  

^a State Key Laboratory for Materials Modification by Laser   (China)

^b INSTITUTE OF SEMICONDUCTORS   (China)

Author keywords

(0 0 2) peaks; PL spectra; PLD; ZnO thin films

Indexed keywords

CRYSTAL STRUCTURE; FILM GROWTH; LIGHT EMISSION; MORPHOLOGY; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; PULSED LASER DEPOSITION; SPECTROSCOPIC ANALYSIS; STOICHIOMETRY; SUBSTRATES; ULTRAVIOLET RADIATION; ZINC OXIDE;

(002) PEAKS; CRYSTALLINITY; PL SPECTRA; ZNO THIN FILMS;

THIN FILMS;

EID: 14644391565     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2004.12.014     Document Type: Article

References (5)

1. P. Zu, Z.K. Tang, G.K.L. Wong, M. Kawasaki, A. Ohtomo, H. Koinuma, and Y. Segawa Solid State Commun 103 1997 459
2. D.C. Reynolds, D.C. Look, B. Jobai, C.W. Litton, T.C. Colliins, W. Harsch, and G. Cantwell Phys Rev B 57 1998 12151
3. N.Y. Garces, L. Wang, L. Bai, N.C. Giles, L.E. Halliburton, and G. Cantwell Appl Phys Lett 81 2002 622
4. B.J. Jin, and S.H. Bae Mater Sci Eng B71 2000 301 305
5. F.K. Shan, B.C. Shin, S.W. Jang, and Y.S. Yu J Eur Ceram Soc 24 2004 1015 1018