Engineering the microstructure of thin films for perpendicular recording

IEEE Transactions on Magnetics

Volumn 41, Issue 2, 2005, Pages 719-723

  Laughlin, David E ^a   Kumar, S ^a   Peng, Yingguo ^a   Roy, Anup G ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Co alloy; Crystallographic texture; Grain distribution; Grain isolation; Grain size; Granular oxide; L10 alloy; Microstructure; Order parameter

Indexed keywords

COBALT ALLOYS; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; GRAIN SIZE AND SHAPE; MAGNETIC ANISOTROPY; MAGNETIC RECORDING; MICROSTRUCTURE; MULTILAYERS;

CRYSTALLOGRAPHIC TEXTURE; GRAIN DISTRIBUTION; GRAIN ISOLATION; GRANULAR OXIDE; L10 ALLOYS; ORDER PARAMETERS;

THIN FILMS;

EID: 14544278362     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2004.839067     Document Type: Article

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