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Volumn 367, Issue 1-2, 2004, Pages 146-148
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Crystal structure of the ternary silicide CeRh2Si
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Author keywords
CeRh2Si; Cerium rhodium silicide; Crystal structure
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Indexed keywords
ANNEALING;
CRYSTAL STRUCTURE;
CRYSTALLOGRAPHY;
DATA ACQUISITION;
DIFFRACTOMETERS;
INTERMETALLICS;
MELTING;
TERNARY SYSTEMS;
X RAY DIFFRACTION ANALYSIS;
CERH2SI;
CERIUM RHODIUM SILICIDE;
X-RAY SINGLE CRYSTAL DIFFRACTION METHOD;
CERIUM COMPOUNDS;
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EID: 1442359409
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2003.08.027 Document Type: Conference Paper |
Times cited : (7)
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References (7)
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