Erratum: Antiresonant ring interferometry as a sensitive techique for measuring nonlinear optical properties of thin films (Optics Communications (2004) 233 (297) DOI: 10.1016/j.optcom.2004.01.051);Antiresonant ring interferometry as a sensitive technique for measuring nonlinear optical properties of thin films

Optics Communications

Volumn 233, Issue 4-6, 2004, Pages 297-304

  Vasa, Parinda ^a   Singh, B P ^b   Taneja, Praveen ^a   Ayyub, Pushan ^a  

^a TATA INSTITUTE OF FUNDAMENTAL RESEARCH   (India)

^b INDIAN INSTITUTE OF TECHNOLOGY BOMBAY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM SULFIDE; FOUR WAVE MIXING; INTERFEROMETRY; LIGHT ABSORPTION; PHOTONS; QUANTUM OPTICS; THIN FILMS;

DEGENERATE FOUR WAVE MIXING (DFWM); EXCITED STATE ABSORPTION;

NONLINEAR OPTICS;

EID: 1442356593     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2004.05.002     Document Type: Erratum

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