Product Robust Design and Process Robust Design: Are They the Same? (No.)

Quality Engineering

Volumn 16, Issue 2, 2003, Pages 193-207

  Shore, Haim ^a   Arad, Ram ^a  

^a BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

Author keywords

Dual response modeling; Parameter design; Robust design; SPC; Taguchi quality philosophy

Indexed keywords

MATHEMATICAL MODELS; OPTIMIZATION; PARAMETER ESTIMATION; PROBLEM SOLVING; PROCESS CONTROL; QUALITY ASSURANCE; ROBUSTNESS (CONTROL SYSTEMS); SIGNAL PROCESSING;

DUAL RESPONSE MODELING; PARAMETER DESIGN; ROBUST DESIGN; SPC; TAGUCHI QUALITY PHILOSOPHY;

PRODUCT DESIGN;

EID: 1442356130     PISSN: 08982112     EISSN: None     Source Type: Journal    
DOI: 10.1081/QEN-120024007     Document Type: Article

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