Development of a terawatt test stand at the university of Missouri for fast, multichannel switching analysis

Digest of Technical Papers-IEEE International Pulsed Power Conference

Volumn , Issue , 2003, Pages 1051-1053

  LeChien, Keith R ^a   Gahl, John M ^a   Kemp, Mark A ^a   Curry, Randy D ^a   Elizondo, Juan M ^b   Struve, Kenneth W ^b  

^a University of Missouri   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXPONENTIAL SWITCH MODELS; LASER TRIGGERED SWITCHES; MULTICHANNEL SWITCHING;

CAPACITORS; COMPUTER SIMULATION; ELECTRIC ARCS; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; ELECTRODES; INDUCTANCE; LASER APPLICATIONS;

SWITCHING;

EID: 1442355378     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

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