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Volumn , Issue , 2002, Pages 912-917
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Quantification of Residual Plastic Strains in Ni-Cr-Mn-Nb GTAW Welds via Electron Backscatter Diffraction
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRON BACKSCATTER DIFFRACTION (EBSD);
GAS-TUNGSTEN-ARC-WELDS (GTAW);
CHROMIUM;
CRYSTAL LATTICES;
DISLOCATIONS (CRYSTALS);
DUCTILITY;
ELECTRON DIFFRACTION;
FRACTURE;
HYDROGEN EMBRITTLEMENT;
MICROSTRUCTURE;
NICKEL;
PLASTICITY;
RECRYSTALLIZATION (METALLURGY);
STRAIN;
TUNGSTEN;
WELDS;
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EID: 1442354895
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (8)
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References (9)
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