Model signal-to-noise comparison for CCD arrays versus film

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3032, Issue , 1997, Pages 125-130

  Shaw, Rodney ^a  

^a HEWLETT PACKARD LABORATORIES   (United States)

Author keywords

CCD arrays; Detectors; DQE analysis; Signal to noise ratio

Indexed keywords

ACOUSTIC INTENSITY; CHARGE COUPLED DEVICES; DETECTORS; DIGITAL CAMERAS; PIXELS; SIGNAL TO NOISE RATIO; TECHNOLOGY TRANSFER;

CCD ARRAYS; CCD IMAGING; DQE ANALYSIS; DYNAMIC RANGE (DR); GRAIN DIMENSIONS; IMAGE NOISE; MODEL COMPARISON; MULTI LEVEL (ML); NOISE RATIOS; OUTPUT SIGNALS; SIMPLE MODELING;

MEDICAL IMAGING;

EID: 1442345614     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.273976     Document Type: Conference Paper

References (5)

1. R. Shaw, "DQE analysis for CCD imaging arrays" Paper at this conference.
2. "Towards the ultimate speed in photography" Conf. papers and summary, J.Phot.Sci., 9, 1961.
3. L.J.Thomas, "Photographic systems analysis" Procs Japanese Soc. for Phot.Sci. & Tech. pp 291-313, December 1980.
4. P.D.Burns, "Signal-to-noise ratio of charge-coupled device imagers" , SPIE 1242, pp 187-194, 1990.
5. J.C.Dainty and R.Shaw, Chapter 3 of "Image Science", Academic Press, New York, 1974.