Reusable integrated components of inter-related patterns for software development

Proceedings - Asia-Pacific Software Engineering Conference, APSEC

Volumn 2000-January, Issue , 2000, Pages 364-371

  Ram, J ^a   Sreekanth, M ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

Computer science; Integrated circuit modeling; Life testing; Object oriented modeling; Pattern analysis; Programming; Software design; Software engineering; Software reusability; Software testing

Indexed keywords

COMPUTER PROGRAMMING; COMPUTER SCIENCE; COMPUTER SOFTWARE; INTEGRATED CIRCUIT TESTING; LIFE CYCLE; MATHEMATICAL PROGRAMMING; OBJECT ORIENTED PROGRAMMING; PROBLEM SOLVING; REUSABILITY; SOFTWARE DESIGN; SOFTWARE ENGINEERING; SOFTWARE TESTING;

GENERAL SOLUTIONS; INTEGRATED CIRCUIT MODELING; LIFE-TESTING; OBJECT ORIENTED MODEL; PATTERN ANALYSIS; REPRESENTATION MECHANISM; SOFTWARE DEVELOPMENT LIFE CYCLE; SOFTWARE DEVELOPMENT PROCESS;

COMPUTER SOFTWARE REUSABILITY;

EID: 1442343505     PISSN: 15301362     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/APSEC.2000.896721     Document Type: Conference Paper

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