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Volumn , Issue , 2002, Pages 318-323
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Friction Stir Weld Inspection Through Conductivity Imaging using Shaped Field MWM®-Arrays
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Author keywords
[No Author keywords available]
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Indexed keywords
ALGORITHMS;
ALUMINUM ALLOYS;
ARRAYS;
COMPUTER SOFTWARE;
EDDY CURRENTS;
ELECTRIC CONDUCTIVITY;
HEAT AFFECTED ZONE;
LOW TEMPERATURE PHENOMENA;
MICROSTRUCTURE;
SENSORS;
STRENGTH OF MATERIALS;
TOUGHNESS;
FRICTION STIR WELDS (FSW);
LACK-OF-PENETRATION (LOP) DEFECTS;
FRICTION WELDING;
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EID: 1442331111
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (7)
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References (6)
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