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Volumn , Issue , 2000, Pages 640-642
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Measuring the Imperfect Dot
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTROPHOTOGRAPHY (EP);
PRINTER DOT;
CLOSED LOOP CONTROL SYSTEMS;
CORRELATION METHODS;
DENSITY (OPTICAL);
DIGITAL CONTROL SYSTEMS;
IMAGE ANALYSIS;
IMAGE QUALITY;
OPTICAL RESOLVING POWER;
PRINTING;
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EID: 1442329619
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (9)
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References (0)
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