Instrumental Analysis of Gloss and Micro-Gloss Variations in Printed Images

Society for Imaging Science and Technology: Image Processing, Image Quality, Image Capture, Systems Conference

Volumn , Issue , 2002, Pages 126-129

  Arney, Jonathan S ^a   Michel, James ^a   Pollmeier, Klaus ^b  

^a ROCHESTER INSTITUTE OF TECHNOLOGY   (United States)

^b George Eastman House   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MICRO-GLOSS VARIATIONS; PRINTED IMAGES;

CAMERAS; GLOSS MEASUREMENT; LIGHT REFLECTION; OPTICAL COLLIMATORS; PRINTING;

IMAGE QUALITY;

EID: 1442324912     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

1. M.A. MacGregor and P.A. Johansson, "Submillimeter gloss variations in coated paper: Part 1: The gloss imaging equipment and analytical techniques", Tappi J. 73:161 (1990).
2. P. Wagberg and P. Johansson, "Surface Profilometry: a comparison between optical and mechanical sensing on printing papers", TAPPI J., 76:115(1993)
3. M.-C. Beland, P.J. Mangin, "Surface Analysis of Paper", T.E. Conners and S. Banerjee, Eds., Ch. 1, CRC Press, Boca Raton, Florida (1995).
4. J. S. Arney, J. Michell, and Klaus Pollmeier, "Instrumental Analysis of Gloss and micro-Gloss Variations in Printed Images", submitted to J. Imag. Sci. & Technol, Fall 2001.
5. I. S. Arney, J. Michell, and Klaus Pollmeier, Provisional Patent Application submitted, August, 2001.
6. J. M. Bennett, L. Marrsson, "Introduction to Surface Roughness and Scattering", 2nd ed., Ch. 3, Optical Soc. of America, Washington, DC (1999).
7. H. E. Bennett and J.O. Porteus, "Relation between surface roughness and specular reflectance at normal incidence", J. Opt. Soc. Am., 51:123 (1961).
8. W. J. Plant, and W. C. Keller, 1990. Evidence of Bragg scattering in microwave Doppler spectra of sea return, J. Geophys. Res., Vol. 95, pp. 16,299-16,310.
9. J. S. Arney, T. Tantalo, and D. Stewart, "The measurement of Surface Topography of Materials by Analysis of Goneometric Reflectance of Light: Factors Governing Precision and Accuracy", J. Imag. Sci. & Tech, 38, 489 (1994)
10. J. S. Arney and D. Stewart, "Surface Topography of Paper from Image Analysis of Reflectance Images", J. Imag. Sci. & Tech., 37, 504.