Predicting whole-program locality through reuse distance analysis

ACM SIGPLAN Notices

Volumn 38, Issue 5, 2003, Pages 245-257

  Ding, Chen ^a   Zhong, Yutao ^a  

^a University of Rochester   (United States)

Author keywords

Data locality; Pattern recognition and prediction; Profiling; Program locality; Reuse distance; Sampling; Stack distance; Training

Indexed keywords

ALGORITHMS; BUFFER STORAGE; COMPUTER PROGRAM LISTINGS; COMPUTER PROGRAMMING LANGUAGES; PATTERN RECOGNITION; PROGRAM COMPILERS;

CACHE MANAGEMENT; DATA LOCALITY; PROFILING; PROGRAM LOCALITY;

COMPUTER SOFTWARE REUSABILITY;

EID: 1442313416     PISSN: 03621340     EISSN: None     Source Type: Journal    
DOI: 10.1145/780822.781159     Document Type: Conference Paper

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