Human reliability analyses by random hazard rate approach

COMPEL - The International Journal for Computation and Mathematics in Electrical and Electronic Engineering

Volumn 23, Issue 1, 2004, Pages 65-78

  Chiodo, E ^a   Gagliardi, F ^a   Pagano, M ^a  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

Author keywords

Human failure; Reliability management; Uncertainty management

Indexed keywords

AUTOMATION; COMPUTER SIMULATION; ELECTRONICS ENGINEERING; FAILURE ANALYSIS; HAZARDS; INFORMATION TECHNOLOGY; LARGE SCALE SYSTEMS; PREVENTIVE MAINTENANCE; PROBABILITY; RELIABILITY; RISK MANAGEMENT; WEIBULL DISTRIBUTION;

HUMAN FAILURE; RELIABILITY MANAGEMENT; UNCERTAINTY MANAGEMENT;

ELECTRICAL ENGINEERING;

EID: 1442313335     PISSN: 03321649     EISSN: None     Source Type: Journal    
DOI: 10.1108/03321640410507554     Document Type: Conference Paper

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