An analytical moderate inversion drain current model for polycrystalline silicon thin-film transistors considering deep and tail states in the grain boundary

Journal of Applied Physics

Volumn 79, Issue 4, 1996, Pages 1961-1967

  Chen, S S ^a   Kuo, J B ^a  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 1442296225     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361046     Document Type: Article

References (21)

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