메뉴 건너뛰기




Volumn 1, Issue , 1998, Pages 825-829

A Michelson type of shear interferometer for non destructive inspection of debondings in structures

Author keywords

[No Author keywords available]

Indexed keywords

COATINGS; EVAPORATION; FLAME SPRAYING; FRICTION; HOLOGRAMS; HOLOGRAPHIC INTERFEROMETRY; INTERFEROMETERS; PLASMA SPRAYING; SPUTTERING; STIFFNESS;

EID: 1442280953     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (13)
  • 5
    • 0000190753 scopus 로고
    • Basic Electronic Speckle Pattern Interferometry
    • chap. 8, Academic Press
    • O Løkberg and G. Slettemoen, "Basic Electronic Speckle Pattern Interferometry", Applied Optics and optical Engineering, Vol. X, chap. 8, pag. 455-504, Academic Press (1987).
    • (1987) Applied Optics and Optical Engineering , vol.10 , pp. 455-504
    • Løkberg, O.1    Slettemoen, G.2
  • 6
    • 0011406773 scopus 로고
    • Non-destructive testing of composite structures using shearography
    • J.F.Silva Gomes et al editors, Lisbon, Portugal
    • J.A.Chouzal et al., "Non-destructive testing of composite structures using shearography", Proc. 10th International Conf. in Experimental Mechanics, J.F.Silva Gomes et al editors, Lisbon, Portugal, pag. 373-378 (1994).
    • (1994) Proc. 10th International Conf. in Experimental Mechanics , pp. 373-378
    • Chouzal, J.A.1
  • 7
    • 0041533049 scopus 로고
    • Electronic shearography versus ESPI for non-destructive testing
    • Y. Hung, "Electronic shearography versus ESPI for non-destructive testing", SPIE 1554B, pag. 692-700 (1991).
    • (1991) SPIE , vol.1554 B , pp. 692-700
    • Hung, Y.1
  • 8
    • 35949044983 scopus 로고
    • An image-shearing speckle-pattern interferometer for measuring bending moments
    • J. Leendertz, J. Butters, "An image-shearing speckle-pattern interferometer for measuring bending moments", J. Physics E: Scien. Instr., Vol. 6, pag. 1107-1110 (1973).
    • (1973) J. Physics E: Scien. Instr. , vol.6 , pp. 1107-1110
    • Leendertz, J.1    Butters, J.2
  • 11
    • 0001006310 scopus 로고
    • Decorrelation and fringe visibility: On the limiting behaviour of various electronic speckle pattern correlation interferometers
    • M. Owner-Peterson, "Decorrelation and fringe visibility: on the limiting behaviour of various electronic speckle pattern correlation interferometers", J.Opt. Soc. Am., Vol. 8, pag. 1082-1089 (1991).
    • (1991) J. Opt. Soc. Am. , vol.8 , pp. 1082-1089
    • Owner-Peterson, M.1
  • 12
    • 0004044474 scopus 로고
    • Marcel Dekker, Inc., New York
    • R. Sirohi, "Speckle metrology", Marcel Dekker, Inc., New York (1993).
    • (1993) Speckle Metrology
    • Sirohi, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.