Metrics for Applying GOF Design Patterns in Refactoring Processes

International Workshop on Principles of Software Evolution (IWPSE)

Volumn , Issue , 2001, Pages 27-36

  Muraki, Taichi ^a   Saeki, Motoshi ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Design Pattern; Meta Model; Refactoring; Software Metrics

Indexed keywords

ABSTRACTING; METADATA; OBJECT ORIENTED PROGRAMMING; SOFTWARE PROTOTYPING;

DESIGN PATTERN; META MODEL; REFACTORING; SOFTWARE METRICS;

COMPUTER SOFTWARE;

EID: 1442278942     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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