메뉴 건너뛰기




Volumn , Issue , 1997, Pages 8-12

FIBER NEAR-FIELD MICROSCOPY

Author keywords

[No Author keywords available]

Indexed keywords


EID: 1442268602     PISSN: None     EISSN: 21622701     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (9)
  • 1
    • 0000644028 scopus 로고
    • A suggested method for extending microscopic resolution into the ultra-microscopic region
    • E. H. Synge, “A suggested method for extending microscopic resolution into the ultra-microscopic region,” Philos. Mag. 6, 356-362 (1928).
    • (1928) Philos. Mag , vol.6 , pp. 356-362
    • Synge, E. H.1
  • 2
    • 33745465986 scopus 로고
    • Super-resolution aperture microscope
    • A.A. Ash and H. Nicholls, “Super-resolution aperture microscope,” Nature, 237, 510(1972).
    • (1972) Nature , vol.237 , pp. 510
    • Ash, A.A.1    Nicholls, H.2
  • 3
    • 0021410769 scopus 로고
    • Optical stethoscopy: image recording with resolution X/20
    • D.W. Pohl, W. Denk, and M. Lanz, “Optical stethoscopy: image recording with resolution X/20”, Appl. Phys. Lett. 44, 651(1984).
    • (1984) Appl. Phys. Lett , vol.44 , pp. 651
    • Pohl, D.W.1    Denk, W.2    Lanz, M.3
  • 4
    • 3743151120 scopus 로고
    • Near-Field Optics: Microscopy, Spectroscopy, and Surface Modification Beyond the Diffraction Limit
    • E. Betzig and J. K. Trautman, ‘Near-Field Optics: Microscopy, Spectroscopy, and Surface Modification Beyond the Diffraction Limit” Science 257, 189-195 (1992)
    • (1992) Science , vol.257 , pp. 189-195
    • Betzig, E.1    Trautman, J. K.2
  • 5
    • 21544436741 scopus 로고
    • Combined shear force and near-field scanning optical microscopy
    • E. Betzig, P.L. Finn, and J.S. Weiner, “Combined shear force and near-field scanning optical microscopy,” Appl. Phys. Lett. 60, 2484(1992)
    • (1992) Appl. Phys. Lett , vol.60 , pp. 2484
    • Betzig, E.1    Finn, P.L.2    Weiner, J.S.3
  • 7
    • 21544443037 scopus 로고
    • Near-field differential scanning optical microscope with atomic force regulation
    • R. Toledo-C row, P.C. Yang, Y. Chen, and M. Vaez-Iravani, “Near-field differential scanning optical microscope with atomic force regulation,” Appl. Phys. Lett. 60, 2957(1992).
    • (1992) Appl. Phys. Lett , vol.60 , pp. 2957
    • Toledo-C row, R.1    Yang, P.C.2    Chen, Y.3    Vaez-Iravani, M.4
  • 8
    • 85166787594 scopus 로고    scopus 로고
    • Interferometric Reflection Mode Near-Field Scanning Optical Microscopy
    • Saeed Pilevar, Walid A. Atia, and Christopher C. Davis, “Interferometric Reflection Mode Near-Field Scanning Optical Microscopy,” Ultramicroscopy, 61, 233-236, 1996.
    • (1996) Ultramicroscopy , vol.61 , pp. 233-236
    • Pilevar, Saeed1    Atia, Walid A.2    Davis, Christopher C.3
  • 9
    • 0001581602 scopus 로고    scopus 로고
    • Imaging of Surface Plasmon Scattering by Lithographically Created Individual Surface Defects
    • I.I. Smolyaninov, D.L. Mazzoni, and C.C. Davis, “Imaging of Surface Plasmon Scattering by Lithographically Created Individual Surface Defects,” Phys. Rev. Lett. 77, 3877-3880, 1996.
    • (1996) Phys. Rev. Lett , vol.77 , pp. 3877-3880
    • Smolyaninov, I.I.1    Mazzoni, D.L.2    Davis, C.C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.