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Volumn 2, Issue , 2004, Pages 821-822
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Reflectivity of SiC/Mg multilayer at wavelengths around 30 nm
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Author keywords
[No Author keywords available]
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Indexed keywords
DENSITY (SPECIFIC GRAVITY);
HARMONIC ANALYSIS;
INFRARED FURNACES;
LIGHT SOURCES;
MAGNESIUM PRINTING PLATES;
MAGNETRON SPUTTERING;
MIRRORS;
REFLECTION;
SILICON CARBIDE;
SURFACE ROUGHNESS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAYS;
EXTREME ULTRAVIOLET PHOTOELECTRON MICROSCOPY;
HIGH-ORDER HARMONICS;
MULTILAYER MIRRORS;
SOFT X-RAY REFLECTIVITY;
MULTILAYERS;
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EID: 14344264039
PISSN: 10928081
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (1)
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References (0)
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