Banding reduction in electrophotographic printer

International Conference on Digital Printing Technologies

Volumn , Issue , 2004, Pages 470-473

  You, Je Hwan ^a   Kim, Hyeong Chae ^a   Han, Sang Yong ^a  

^a SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

FAST FOURIER TRANSFORMS; LASER BEAMS; MIRRORS; PHOTOCONDUCTIVITY; SYSTEMS ANALYSIS; VIBRATION CONTROL;

LASER BEAM PRINTER (LBP); LASER SCANNING UNIT (LSU); ORGANIC PHOTO-CONDUCTIVE (OPC); ROUGH BANDING;

PRINTERS (COMPUTER);

FOURIER ANALYSIS; MIRRORS; PHOTOCONDUCTIVITY; PRINTERS; SYSTEMS ENGINEERING; VIBRATION CONTROL;

EID: 14244268250     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. Michael T.S. Ewe, Jim M. Grice, George T.-C. Chiu and Jan P. Allebach, "Banding Reduction in Electrophotographic Process Using Piezoelectric Actuated Laser Beam Deflection Device", IS&T's NIP16, pp.276-280, 2000
2. Guo-Yan Lin, Jimmy M.Grice, Jan P. Allebach, and George Chiu, "Banding Artifact Reduction in Electrophotographic Printers by Using Pulse Width Modulation", IS&T's NIP16, pp.281-286, 2000
3. Cheng-Lun Chen, George T.-C.Chiu and Jan P. Allebach, "Banding Artifact Reduction in Electrophotographic Process Using OPC Drum Velocity Control", IS&T's NIP17, pp.60-66, 2001
4. Wencheng Wu, Edul N.Dalai, and D.Rene Rasmussen, "Perceptibility of Non-sinusoidal Bands", IS&T's NIP 18, pp.462-466, 2002
5. Yousun Bang, Zygunt Pizlo, and Jan P. Allebach, "Discrimination Based Banding Assessment", IS&T's NIP19, pp.745-750, 2003