Texture and residual-stress analysis using a kappa goniometer

Journal of Applied Crystallography

Volumn 32, Issue 3, 1999, Pages 393-396

  Guillen R ^a   Francois M ^a   Bourniquel, B ^a   Girard, E ^a  

^a INSTITUT DE RECHERCHE EN GÉNIE CIVIL ET MÉCANIQUE GEM   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 14244256225     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889898015064     Document Type: Article

References (9)

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3. Guillén, R., Cossu, C., Jacquot, T., François, M. & Bourniquel, B. (1999). J. Appl. Cryst. 32, 387-392.
4. Jacquot, Th. (1997). Doctoral thesis, University of Nantes, France.
5. Langouche, F., Aernoudt, E. & Van Houtte, P. (1989). J. Appl. Cryst. 22, 533-538.
6. Montesin, T. & Heizmann, J. J. (1990). Rev. Metall. (April), pp. 217-232.
7. Moreau, B., Wagner, F. & Goebel, H. (1994). Proc. ICOTOM-10. Mater. Sci. Forum, 157-162, 159-166.
8. Robinson, I. K. (1994). Synchrotron Rad. News, 7, 5-7.
9. Szpunar, J. & Blandford, P. (1994). Proc. ICOTOM-10. Mater. Sci. Forum, 157-162, 207-212.