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Volumn 3, Issue , 2004, Pages 201-218

Failure analysis in subsystem design for space missions

Author keywords

Electromechanical failure; Failure analysis; Failure mode taxonomy

Indexed keywords

ACCIDENT PREVENTION; ELECTROMECHANICAL DEVICES; FAILURE ANALYSIS; FUNCTIONS; MATRIX ALGEBRA; NATURAL LANGUAGE PROCESSING SYSTEMS; RISK ASSESSMENT; CONCEPTUAL DESIGN; FAILURE (MECHANICAL); FAILURE MODES; NASA; SPACE APPLICATIONS;

EID: 14044276429     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/detc2004-57338     Document Type: Conference Paper
Times cited : (33)

References (26)
  • 1
    • 0026966054 scopus 로고
    • Are components still the major problem: A review of electronic system and device field failure returns
    • Pecht, M. and Ramappan, V., 1992, "Are Components Still the Major Problem: A Review of Electronic System and Device Field Failure Returns," IEEE Transactions on Components, Hybrids, and Manufacturing Technology, 15 (6): 1160-1164.
    • (1992) IEEE Transactions on Components, Hybrids, and Manufacturing Technology , vol.15 , Issue.6 , pp. 1160-1164
    • Pecht, M.1    Ramappan, V.2
  • 2
    • 0022082008 scopus 로고
    • Failure modes and mechanisms for VLSI ICs - A review
    • Fantini, F. and Morandi, C., 1985, "Failure Modes and Mechanisms for VLSI ICs - A Review," Electronic Circuits and Systems, 132 (June): 74-81.
    • (1985) Electronic Circuits and Systems , vol.132 , Issue.JUNE , pp. 74-81
    • Fantini, F.1    Morandi, C.2
  • 3
    • 0035790834 scopus 로고    scopus 로고
    • Analytical methods for mapping function to failure during high-risk component development
    • Pittsburgh, PA U.S.A.
    • Tumer, I. Y. and Stone, R. B., 2001, "Analytical Methods for Mapping Function to Failure During High-Risk Component Development," Design Engineering Technical Conferences, Pittsburgh, PA U.S.A.
    • (2001) Design Engineering Technical Conferences
    • Tumer, I.Y.1    Stone, R.B.2
  • 6
    • 0029195269 scopus 로고
    • Failure mode effects analysis: A practical application of functional modeling
    • Hunt, J. E., Pugh, D. R. and Price, C. P., 1995, "Failure Mode Effects Analysis: A Practical Application of Functional Modeling," Applied Artificial Intelligence, 9 (1): 33-44.
    • (1995) Applied Artificial Intelligence , vol.9 , Issue.1 , pp. 33-44
    • Hunt, J.E.1    Pugh, D.R.2    Price, C.P.3
  • 10
    • 0036504271 scopus 로고    scopus 로고
    • A functional basis for engineering design: Reconciling and evolving previous efforts
    • Hirtz, J., Stone, R., McAdams, D., Szykman, S. and Wood, K., 2002, "A Functional Basis for Engineering Design: Reconciling and Evolving Previous Efforts," Research in Engineering Design, 13 (2): 65-82.
    • (2002) Research in Engineering Design , vol.13 , Issue.2 , pp. 65-82
    • Hirtz, J.1    Stone, R.2    McAdams, D.3    Szykman, S.4    Wood, K.5
  • 13
    • 1842713066 scopus 로고    scopus 로고
    • Enhancing virtual product representations for advanced design repository systems
    • Chicago, IL, DETC2003/CIE-48239
    • Bohm, M., Stone, R. and Szykman, S., 2003, "Enhancing Virtual Product Representations for Advanced Design Repository Systems," Proceedings of DETC2003, Chicago, IL, DETC2003/CIE-48239.
    • (2003) Proceedings of DETC2003
    • Bohm, M.1    Stone, R.2    Szykman, S.3
  • 14
    • 0026374740 scopus 로고
    • Material failure mechanisms and damage models
    • Dasgupta, A. and Pecht, M., 1991, "Material Failure Mechanisms and Damage Models," IEEE Transactions on Reliability, 40 (5): 531-536.
    • (1991) IEEE Transactions on Reliability , vol.40 , Issue.5 , pp. 531-536
    • Dasgupta, A.1    Pecht, M.2
  • 19
  • 20
    • 1942519467 scopus 로고
    • Chapter 2: Overview of Failure Mechanisms and Failure Modes in CMOS ICs, Stanford University, Stanford, CA USA
    • Hao, H., 1993, Electrical Failure Modes in CMOS Logic Integrated Circuits, Chapter 2: Overview of Failure Mechanisms and Failure Modes in CMOS ICs, Stanford University, Stanford, CA USA.
    • (1993) Electrical Failure Modes in CMOS Logic Integrated Circuits
    • Hao, H.1
  • 23
    • 0024864302 scopus 로고
    • Electrical properties and detection methods for CMOS IC defects
    • Paris France
    • Soden, J. M. and Hawkins, C. F., 1989, "Electrical Properties and Detection Methods for CMOS IC Defects," European Test Conference, Paris France.
    • (1989) European Test Conference
    • Soden, J.M.1    Hawkins, C.F.2
  • 24
    • 0022871954 scopus 로고
    • MOS VLSI reliability and yield trends
    • Woods, M. H., 1986, "MOS VLSI Reliability and Yield Trends," Proceedings of the IEEE, 74 (12): 1715-1729.
    • (1986) Proceedings of the IEEE , vol.74 , Issue.12 , pp. 1715-1729
    • Woods, M.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.