Analytical techniques for trace element analysis: An overview

TrAC - Trends in Analytical Chemistry

Volumn 24, Issue 3 SPEC. ISS., 2005, Pages 266-274

  Brown, Richard J C ^a   Milton, Martin J T ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

Limit of detection; Method comparability; Systematic bias; Trace analysis

Indexed keywords

ATOMIC SPECTROSCOPY; MATRIX ALGEBRA; VOLTMETERS; X RAY ANALYSIS;

ATOMIC SPECTROMETRIC TECHNIQUES; DIVERSE MATRICES; POTENTIOMETRIC TECHNIQUES; VOLTAMMETRIC TECHNIQUES;

TRACE ELEMENTS;

AMALGAM; MERCURY; TRACE ELEMENT;

ACCURACY; ANALYTIC METHOD; ANODIC STRIPPING POTENTIOMETRY; ATOMIC ABSORPTION SPECTROMETRY; CHEMICAL ANALYSIS; ELECTROCHEMICAL ANALYSIS; ELECTRODE; MASS SPECTROMETRY; MEASUREMENT; POTENTIOMETRY; PRIORITY JOURNAL; REVIEW; SOLID; X RAY; X RAY FLUORESCENCE;

EID: 13944280561     PISSN: 01659936     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.trac.2004.11.010     Document Type: Article

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