Simulation and sensitivity analysis of nonuniform transmission lines using integrated congruence transform

IEEE Transactions on Advanced Packaging

Volumn 28, Issue 1, 2005, Pages 32-44

  Gad, Emad ^a   Nakhla, Michel ^b  

^a UNIVERSITY OF OTTAWA   (Canada)

^b CARLETON UNIVERSITY   (Canada)

Author keywords

Circuit simulation; High speed interconnects; Integrated congruence transform; Nonuniform transmission lines; Sensitivity computation; Simulation and analysis

Indexed keywords

ALGORITHMS; ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK PARAMETERS; EQUIVALENT CIRCUITS; MATHEMATICAL MODELS; MATHEMATICAL TRANSFORMATIONS; SENSITIVITY ANALYSIS; THEOREM PROVING; TIME DOMAIN ANALYSIS;

CIRCUIT SIMULATION; HIGH SPEED INTERCONNECTS; INTEGRATED CONGRUENCE TRANSFORM; NONUNIFORM TRANSMISSION LINES; SENSITIVITY COMPUTATION;

TRANSMISSION LINE THEORY;

EID: 13944262859     PISSN: 15213323     EISSN: None     Source Type: Journal    
DOI: 10.1109/TADVP.2004.841675     Document Type: Article

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