Multireflection planar time-of-flight mass analyzer. II: The high-resolution mode

Technical Physics

Volumn 50, Issue 1, 2005, Pages 82-86

  Verentchikov, A N ^a   Yavor, M I ^a   Hasin, Yu I ^a   Gavrik, M A ^a  

^a INSTITUTE FOR ANALYTICAL INSTRUMENTATION   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 13944258183     PISSN: 10637842     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1854828     Document Type: Article

References (11)

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